CEC Test General

Form shanghai ATC

Date:06/05/07

    CEC Test in Shanghai ATC lab will be carried out on QD882CA platform, Electrical test equipment also includes digital oscilloscope DL1640, the test includes the low level protocol tests which every device must adhere to and a set of feature based tests which apply only to devices that support that particular feature.

Low level protocol tests include:
(1)Electrical Test:
    CEC line driver Logic '0' and '1' output voltage level
    Maximum rise time and fall time
    Signaling and Bit Timings:
    CEC line driver 'Start'/'0'/'1' Bit dutycycle tolerance
(2)Frame Communication:
    Correct ACK usage
    Correct header block usage
    Correct retransmission usage
    Frame validation check
    Proper error handling
    Control signal line arbitration
    Correct free time between signals
(3)Device Installation and Addressing:
    Physical address allocation
    Logical address allocation
    A device that fails any low level tests listed above shall not claim to be CEC compliant

Feature tests include:
    One touch play
    Routing control
    System standby
    One touch record
    System information
    Deck control
    Tuner control
    Vendor specific commands
    ODS status display
    Device OSD name transfer
    Device menu control
    Remote control pass through
    Give device power status

    A device that fails a feature test shall not claim to support that feature in its CDF (Capabilities Declaration Form)

teeting fee:$5000